Implementation can be preclusive, owing to difficulties in characterizing tip-sample interactions and accounting for probe degradation, both of which are crucial factors in process efficacy. This technique has been valuable in studying resistance switching memories and solar cells, although its broader use has been hindered by a lack of understanding of its reliability and practicality. Recently, the scope of application has broadened with the arrival of conductance tomography, a technique for mapping current in three-dimensions in electronic devices by gradually removing sample material with the scanning probe. The atomic force microscope (AFM) empowers research into nanoscale structural and functional material properties. 2Institute of Functional Nano and Soft Materials Collaborative Innovation Center of Suzhou Nanoscience & Technology Soochow University, Suzhou, China.1Department of Electronic and Electrical Engineering, University College London, London, United Kingdom.Ng 1, Stephen Hudziak 1, Adnan Mehonic 1, Mario Lanza 2 and Anthony J.
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